Spectrum

SCPI Commands :

CONFigure:NRSub:MEASurement<Instance>:MEValuation:SCOunt:SPECtrum:SEMask
CONFigure:NRSub:MEASurement<Instance>:MEValuation:SCOunt:SPECtrum:ACLR
Commands in total: 2
Subgroups: 0
Direct child commands: 2
get_aclr() int[source]
# CONFigure:NRSub:MEASurement<Instance>:MEValuation:SCOunt:SPECtrum:ACLR
value: int = driver.configure.nrSubMeas.multiEval.scount.spectrum.get_aclr()

Specifies the statistic count of the measurement. The statistic count is equal to the number of measurement intervals per single shot. Separate statistic counts for ACLR and spectrum emission mask measurements are supported.

Returns:

statistic_count: Number of measurement intervals (slots)

get_se_mask() int[source]
# CONFigure:NRSub:MEASurement<Instance>:MEValuation:SCOunt:SPECtrum:SEMask
value: int = driver.configure.nrSubMeas.multiEval.scount.spectrum.get_se_mask()

Specifies the statistic count of the measurement. The statistic count is equal to the number of measurement intervals per single shot. Separate statistic counts for ACLR and spectrum emission mask measurements are supported.

Returns:

statistic_count: Number of measurement intervals (slots)

set_aclr(statistic_count: int) None[source]
# CONFigure:NRSub:MEASurement<Instance>:MEValuation:SCOunt:SPECtrum:ACLR
driver.configure.nrSubMeas.multiEval.scount.spectrum.set_aclr(statistic_count = 1)

Specifies the statistic count of the measurement. The statistic count is equal to the number of measurement intervals per single shot. Separate statistic counts for ACLR and spectrum emission mask measurements are supported.

Parameters:

statistic_count – Number of measurement intervals (slots)

set_se_mask(statistic_count: int) None[source]
# CONFigure:NRSub:MEASurement<Instance>:MEValuation:SCOunt:SPECtrum:SEMask
driver.configure.nrSubMeas.multiEval.scount.spectrum.set_se_mask(statistic_count = 1)

Specifies the statistic count of the measurement. The statistic count is equal to the number of measurement intervals per single shot. Separate statistic counts for ACLR and spectrum emission mask measurements are supported.

Parameters:

statistic_count – Number of measurement intervals (slots)